A new generation of researchers improving knowledge of materials characterization methods

Research Assistant from the ISSP UL’s Laboratory of Microscopy, Edgars Vanags, attended a course called “Advanced Characterization of Materials at the Micro-, Nano and Atomic Scale”, which took place at Eidgenössische Technische Hochschule Zürich (ETH Zurich, Hönggerberg campus) from 7 to 10 of November 2022 and was organized by École Polytechnique fédérale de Lausanne (EPFL).

During the lectures, a broad theoretical basis by experts in the field was given to the course participants about the application of various types of radiation in laboratory tools for the characterization of materials in physics, chemistry and material science. The course covered instrumental analysis methods such as TEM, STEM, SEM/FIB, in-situ TEM, cryo-TEM, X-ray, Raman analysis methods, atom probe tomography and secondary ion mass spectrometry. Most of the mentioned analysis tools are available at the ISSP UL laboratories. After the lectures, equipment demonstrations and Q&A sessions took place. The knowledge acquired during the course will increase the competence of the Microscopy laboratory where Edgars Vanags is analyzing samples of the materials.